Title :
A strategy for board level in-system programmable built-in assisted test and built-in self test
Author :
Ferry, Joshua ; Scesnak, Jozef ; Shaikh, Shoeib
Author_Institution :
ATE Operations Div., Teradyne, Inc., North Reading, MA
Abstract :
In-system programmable (ISP) built-in self test (BIST) and built-in assisted test (BIAT) is a board test strategy that utilizes field programmable gate arrays (FPGAs), reconfigured solely for the application of test vectors. These test vectors are designed to either assure manufacturing & operational quality or assist in the functional verification. While mitigating lack of test access is the most prevalent application, increased device test capability as well as lower development times is realized in board test and system test
Keywords :
boundary scan testing; built-in self test; field programmable gate arrays; printed circuit testing; FPGA; board test; built-in assisted test; built-in self test; field programmable gate arrays; functional verification; in-system programmable test; test access; test vectors; Automatic testing; Built-in self-test; Circuit testing; Design engineering; Field programmable gate arrays; Logic testing; Performance evaluation; Product design; Production; System testing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584043
