March AB, March AB1: new March tests for unlinked dynamic memory faults

Author

Benso, A. ; Bosio, A. ; Carlo, S. Di ; Natale, G. Di ; Prinetto, P.

Author_Institution

Dipt. di Automatica e Informatica, Politecnico di Torino

fYear

2005

fDate

8-8 Nov. 2005

Lastpage

841

Abstract

Among the different types of algorithms proposed to test static random access memories (SRAMs), March tests have proven to be faster, simpler and regularly structured. New memory production technologies introduce new classes of faults usually referred to as dynamic memory faults. A few March tests for dynamic fault, with different fault coverage, have been published. In this paper, we propose new March tests targeting unlinked dynamic faults with lower complexity than published ones. Comparison results show that the proposed March tests provide the same fault coverage of the known ones, but they reduce the test complexity, and therefore the test time

Keywords

SRAM chips; fault diagnosis; integrated circuit testing; logic testing; March AB test; March AB1 test; SRAM; fault coverage; integrated circuit testing; memory production technologies; static random access memories; unlinked dynamic memory faults; Access protocols; Automatic testing; Fault detection; Hardware; Production; SRAM chips; Silicon; System testing; System-on-a-chip; Technology forecasting;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2005. Proceedings. ITC 2005. IEEE International

Conference_Location

Austin, TX

Print_ISBN

0-7803-9038-5

Type

conf

DOI

10.1109/TEST.2005.1584047

Filename

1584047