• DocumentCode
    3132426
  • Title

    Explore the impact of improvement that the Polyimide adhesive residue on QFN Package

  • Author

    Liu, Kent-Ting

  • Author_Institution
    Appl. Sci. Dept. of Chem. & Mater. Eng., Nat. Kaohsiung Univ., Kaohsiung, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    670
  • Lastpage
    673
  • Abstract
    The main purpose of this research is to confer the tape of polyimide apply to the packaging technology of quad flat no lead (QFN), because QFN is signal side package (one side is compound and one side is metal surface adhesion area). So it can prevent the exceeding glue after molding when this tape is stuck on the metal surface. There are two kinds of materials of lead frame. One is copper and another is PPF (Ni/Pd/Au). For these two kinds of materials, this research will analyze the exceeding glue amount of the tapes and find out the importance of quality characters, and also use variation analysis method to get the best parameter. I found QFN product after molding, which the amount of glue after de-tape will affect the performance of appearance and solderability due to the plasma parameter of front process and post curing conditions. So I want to find out a root cause and effective direction by studying the whole process of packaging manufacturing and hope my research will be useful to QFN packaging technology and other related industry.
  • Keywords
    adhesives; copper; gold; integrated circuit packaging; nickel; palladium; Cu; IC packaging; Ni-Pd-Au; QFN packaging technology; lead frame; metal surface; metal surface adhesion area; packaging manufacturing; plasma parameter; polyimide adhesive residue; quad flat no lead package; signal side package; variation analysis method; Adhesives; Copper; Curing; Gold; Lead; Manufacturing processes; Packaging; Plasma applications; Plasma materials processing; Polyimides; Plasma parameter tape stick solder-ability; Quad Flat No Lead (QFN); metal surface adhesion area;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382276
  • Filename
    5382276