Title :
Evaluation system of product maturity level for the third generation semiconductor microwave device based on Web
Author :
Zhaofeng, Gao ; Jie, Huang ; Kui, Zhang
Author_Institution :
China Electron. Technol. Group Corp., Electron. Reliability Eng. & Technol. Co. Ltd., Shijiazhuang, China
Abstract :
Aiming at the exigent need of product maturity level evaluation for the third generation semiconductor microwave device and the shortages of current domestic and foreign evaluation methods, this paper extends the traditional Technology Readiness Level (TRL) evaluation method roundly from technology integration and technology dimension, establishes a structural describing and measuring model for product maturity, proposes a quantitative computing method based on questionnaire mode using Analytic Hierarchy Process (AHP) and attribute mathematics, builds a product maturity level evaluation system for the third generation semiconductor microwave device based on Web, and at last realizes an all-round evaluation of product maturity objectively and effectively.
Keywords :
Internet; electronic engineering computing; microwave devices; production engineering computing; World Wide Web; analytic hierarchy process; evaluation system; product maturity level; technology readiness level; third generation semiconductor microwave device; Analytical models; Manufacturing; Materials; Microwave communication; Microwave devices; microwave device; product maturity level; technology dimension; technology integration; the third generation semiconductor;
Conference_Titel :
Computing, Control and Industrial Engineering (CCIE), 2011 IEEE 2nd International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-9599-3
DOI :
10.1109/CCIENG.2011.6008111