Title :
Parallel, multi-DUT testing in an open architecture test system
Author :
Adachi, Toshiaki ; Pramanick, Ankan ; Elston, Mark
Author_Institution :
Advantest R&D Center Inc., Santa Clara, CA
Abstract :
Parallel testing provides an increase in throughput without a corresponding increase in cost, by performing tests on multiple devices under test at the same time. Addition of this capability to a modular, re-configurable, open architecture test system paves the way for an even more cost-effective solution. This paper describes the parallel test strategy adopted in the T2000 tester from Advantest Corporation, which is based on the OPENSTARtrade platform
Keywords :
automatic test equipment; automatic testing; integrated circuit testing; open systems; parallel architectures; reconfigurable architectures; Advantest Corporation; OPENSTAR platform; T2000 tester; automatic test equipment; modular test system; multiDUT testing; multidevice under test; multiple devices under test; open architecture test system; parallel testing; re-configurable test system; Automatic testing; Computer architecture; Control systems; Costs; Hardware; Performance evaluation; Semiconductor device testing; Software testing; System testing; Throughput;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584053
