• DocumentCode
    3132739
  • Title

    Test generation for ultra-high-speed asynchronous pipelines

  • Author

    Shi, Feng ; Makris, Yiorgos ; Nowick, Steven M. ; Singh, Montek

  • Author_Institution
    Electr. Eng. Dept., Yale Univ., New Haven, CT
  • fYear
    2005
  • fDate
    8-8 Nov. 2005
  • Lastpage
    1018
  • Abstract
    We propose a methodology for testing ultra-high-speed asynchronous pipelines, the latest and most promising asynchronous circuit design style. Unlike traditional delay-insensitive asynchronous micro-pipelines, which use slow capture-pass latches, these circuits employ aggressive handshaking protocols and transparent latches between fine-grain pipeline stages, in order to achieve high performance. Their functional robustness, however, relies on certain timing constraints that need to be satisfied. As a result, these circuits are no longer delay-insensitive, which means that stuck-at faults are not always leading to pipeline stalling. In addition, delay faults may result in violation of these timing constraints, thus affecting not only performance, as in delay-insensitive micro-pipelines, but also functional correctness. To address these new challenges, we develop a test method for both stuck-at and timing constraint violation faults in fine-grain ultra-high-speed asynchronous pipelines. The efficiency of the proposed method is demonstrated on MOUSETRAP, a recently developed pipeline for high-speed applications
  • Keywords
    asynchronous circuits; automatic test pattern generation; fault diagnosis; flip-flops; logic testing; pipeline processing; MOUSETRAP pipeline; asynchronous circuit design; delay faults; delay-insensitive micro-pipelines; fine-grain pipeline stages; handshaking protocols; stuck-at faults; timing constraint violation faults; timing constraints; transparent latches; ultra-high-speed asynchronous pipelines; Asynchronous circuits; Circuit faults; Circuit testing; Clocks; Computer science; Delay; Latches; Pipelines; Protocols; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2005. Proceedings. ITC 2005. IEEE International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-9038-5
  • Type

    conf

  • DOI
    10.1109/TEST.2005.1584067
  • Filename
    1584067