• DocumentCode
    3132762
  • Title

    Blinking Artifact Removal in Cognitive EEG Data Using ICA

  • Author

    Li, Ruijiang ; Principe, Jose C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    5273
  • Lastpage
    5276
  • Abstract
    Eye blinking artifacts present serious problems for electroencephalographic (EEG) interpretation and analysis. In this study, we apply independent component analysis (ICA) to eye blinking artifact removal from cognitive EEG recordings. Due to the specific design of the experiment, the eye blinks almost always co-occur with the event-related potentials (ERP), which creates problems for ICA. We introduced another data set of spontaneous blink and combined it with single-trial ERP data. Our results show that ICA on the combined data set gives separation that makes more sense and makes it easier for EEG interpretation and analysis
  • Keywords
    bioelectric potentials; biomechanics; cognition; electroencephalography; eye; independent component analysis; EEG analysis; ICA; cognitive EEG; electroencephalographic interpretation; event-related potentials; eye blinking artifact removal; independent component analysis; Blind source separation; Brain modeling; Electroencephalography; Enterprise resource planning; Independent component analysis; Magnetic analysis; Muscles; Principal component analysis; Signal analysis; Source separation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260605
  • Filename
    4462994