• DocumentCode
    3132785
  • Title

    3-D finite-element modeling of multi-finger high-power amplifiers with compact heat-dissipation packaging structures

  • Author

    Tseng, H.C. ; Chen, J.Y.

  • Author_Institution
    Nanotechnol. R&D Center, Kun Shan Univ., Yung-Kang, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    18
  • Lastpage
    19
  • Abstract
    The temperature distribution of heat-dissipation structures has been designed using the 3-D thermal FEM method. Results on multi-finger InGaP C-up HBTs demonstrate that the thickness of heat-dissipation packaging configurations can be further reduced by 40%, and the achieved heat-dissipation performance will not be deteriorated. From this efficient analysis, it is believed that miniaturization of C-up HBTs with compact heat-dissipation structures can be used in small-scale HPAs.
  • Keywords
    cooling; finite element analysis; gallium compounds; heterojunction bipolar transistors; indium compounds; power amplifiers; thermal management (packaging); 3-D finite-element modeling; 3-D thermal FEM method; collector-up HBT; heat-dissipation packaging structures; multifinger high-power amplifiers; small-scale HPA; Cities and towns; Fingers; Finite element methods; Heat transfer; Heterojunction bipolar transistors; High power amplifiers; Packaging; Temperature distribution; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382298
  • Filename
    5382298