DocumentCode
3132808
Title
Electro-thermo-mechanical design and electromigration analysis for Package-On-Package (POP)
Author
Hsu, Hsiang-Chen ; Ju, Shen-Wen ; Lu, Jie-Rong ; Fu, Shen-Li
Author_Institution
Dept. of Mech. & Autom. Eng., I-Shou Univ., Dashu Township, Taiwan
fYear
2009
fDate
21-23 Oct. 2009
Firstpage
23
Lastpage
26
Abstract
A comprehensive integrated electro-thermo coupling model is developed to investigate the electro-thermo-mechanical effects and electromigration analysis on Package-on-Package (POP) in this paper. POP packaging involves in ultra thin gold wire (¿=1mil) on wirebonding and Sn4.0Ag0.6Cu (SAC405) solder ball on package. The current density arising in the aluminum pad (wirebonding) and in the Copper trace above SAC405 solder ball imply the hot spot where results in an electromigration along the current direction. Finite element predictions reveal the maximum electro-thermo-mechanical effective stress is located at the regions where electromigration potentially occurred. Reliability on electro-thermo-mechanical for wirebonding and SAC405 solder ball is evaluated. Current crowding, temperature distribution and electro-thermo induced effective stress distribution are predicted. A series of comprehensive parametric studies were conducted in this research.
Keywords
copper alloys; electromechanical effects; electromigration; finite element analysis; lead bonding; packaging; silver alloys; solders; tin alloys; Sn4.0Ag0.6Cu; current crowding; current density; electro-thermo induced effective stress distribution; electro-thermo-mechanical design; electromigration analysis; finite element predictions; package-on-package; solder ball on package; temperature distribution; wirebonding; Aluminum; Copper; Current density; Electromigration; Finite element methods; Gold; Packaging; Stress; Tin; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location
Taipei
Print_ISBN
978-1-4244-4341-3
Electronic_ISBN
978-1-4244-4342-0
Type
conf
DOI
10.1109/IMPACT.2009.5382299
Filename
5382299
Link To Document