• DocumentCode
    3132808
  • Title

    Electro-thermo-mechanical design and electromigration analysis for Package-On-Package (POP)

  • Author

    Hsu, Hsiang-Chen ; Ju, Shen-Wen ; Lu, Jie-Rong ; Fu, Shen-Li

  • Author_Institution
    Dept. of Mech. & Autom. Eng., I-Shou Univ., Dashu Township, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    23
  • Lastpage
    26
  • Abstract
    A comprehensive integrated electro-thermo coupling model is developed to investigate the electro-thermo-mechanical effects and electromigration analysis on Package-on-Package (POP) in this paper. POP packaging involves in ultra thin gold wire (¿=1mil) on wirebonding and Sn4.0Ag0.6Cu (SAC405) solder ball on package. The current density arising in the aluminum pad (wirebonding) and in the Copper trace above SAC405 solder ball imply the hot spot where results in an electromigration along the current direction. Finite element predictions reveal the maximum electro-thermo-mechanical effective stress is located at the regions where electromigration potentially occurred. Reliability on electro-thermo-mechanical for wirebonding and SAC405 solder ball is evaluated. Current crowding, temperature distribution and electro-thermo induced effective stress distribution are predicted. A series of comprehensive parametric studies were conducted in this research.
  • Keywords
    copper alloys; electromechanical effects; electromigration; finite element analysis; lead bonding; packaging; silver alloys; solders; tin alloys; Sn4.0Ag0.6Cu; current crowding; current density; electro-thermo induced effective stress distribution; electro-thermo-mechanical design; electromigration analysis; finite element predictions; package-on-package; solder ball on package; temperature distribution; wirebonding; Aluminum; Copper; Current density; Electromigration; Finite element methods; Gold; Packaging; Stress; Tin; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382299
  • Filename
    5382299