• DocumentCode
    3132836
  • Title

    STIL persistence [data reduction]

  • Author

    Maston, Greg ; Villar, Julie

  • Author_Institution
    Synopsys Inc., Mountain View, CA
  • fYear
    2005
  • fDate
    8-8 Nov. 2005
  • Lastpage
    1081
  • Abstract
    The standard test interface language (STIL; IEEE Std. 1450-1999) supports multiple types of data persistence. The purpose of data persistence is to provide mechanisms for data reduction, and to support uniform interpretation of STIL data. However these behaviors warrant an in-depth examination to eliminate misconceptions from affecting a STIL test flow
  • Keywords
    IEEE standards; computerised instrumentation; IEEE Std. 1450-1999; STIL data; data persistence; data reduction; standard test interface language; Drives; Hardware; Pulse generation; Terminology; Testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2005. Proceedings. ITC 2005. IEEE International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-9038-5
  • Type

    conf

  • DOI
    10.1109/TEST.2005.1584074
  • Filename
    1584074
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3132836