Title :
STIL persistence [data reduction]
Author :
Maston, Greg ; Villar, Julie
Author_Institution :
Synopsys Inc., Mountain View, CA
Abstract :
The standard test interface language (STIL; IEEE Std. 1450-1999) supports multiple types of data persistence. The purpose of data persistence is to provide mechanisms for data reduction, and to support uniform interpretation of STIL data. However these behaviors warrant an in-depth examination to eliminate misconceptions from affecting a STIL test flow
Keywords :
IEEE standards; computerised instrumentation; IEEE Std. 1450-1999; STIL data; data persistence; data reduction; standard test interface language; Drives; Hardware; Pulse generation; Terminology; Testing; Timing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584074
