• DocumentCode
    3132881
  • Title

    The incorporation behavior of As and P in GaInAsP(λ≈1.3 μm) on InP grown by gas source molecular beam epitaxy

  • Author

    Lee, Tsuen-Lin ; Liu, Jin-Shung ; Lin, Hao-Hsiung

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    1995
  • fDate
    9-13 May 1995
  • Firstpage
    179
  • Lastpage
    182
  • Abstract
    In this report, a series of GaxIn1-xAsy P1-y quaternary alloys (λ≈1.3 μm) on (100) InP were grown by gas source MBE (GSMBE) with different gas flow rate ratios (PH3/(PH3+AsH3)). A simple growth model was proposed to describe the group V incorporation behavior quantitatively. Without the complicated chemical reaction parameters, the incorporation probability is controlled by the effective concentrations of the group V atoms on the migration state. Only two parameters, As to P incorporation ratio and the conversion factor between the gas flux rate and the gas flow rate, exist in this model. Furthermore, the model can be expanded to the whole range of alloy compositions by adjusting the incorporation ratio only. It is found that the incorporation ratio strongly depends on the Ga-compositions in Ga xIn1-xAsyP1-y alloys
  • Keywords
    III-V semiconductors; chemical beam epitaxial growth; gallium arsenide; gallium compounds; indium compounds; semiconductor growth; (100) InP substrate; 490 C; AsH3; GSMBE; GaxIn1-xAsyP1-y quaternary alloys; GaInAsP; InP; PH3; PH3-AsH3; chemical reaction parameters; conversion factor; gas flow rate; gas flow rate ratios; gas flux rate; gas source molecular beam epitaxy; group V incorporation behavior; growth model; growth temperature; incorporation probability; incorporation ratio; Atomic layer deposition; Chemical elements; Curve fitting; Equations; Fluid flow; Indium phosphide; Molecular beam epitaxial growth; Optoelectronic devices; Steady-state; Surface fitting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on
  • Conference_Location
    Hokkaido
  • Print_ISBN
    0-7803-2147-2
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1995.522108
  • Filename
    522108