DocumentCode
3132881
Title
The incorporation behavior of As and P in GaInAsP(λ≈1.3 μm) on InP grown by gas source molecular beam epitaxy
Author
Lee, Tsuen-Lin ; Liu, Jin-Shung ; Lin, Hao-Hsiung
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
1995
fDate
9-13 May 1995
Firstpage
179
Lastpage
182
Abstract
In this report, a series of GaxIn1-xAsy P1-y quaternary alloys (λ≈1.3 μm) on (100) InP were grown by gas source MBE (GSMBE) with different gas flow rate ratios (PH3/(PH3+AsH3)). A simple growth model was proposed to describe the group V incorporation behavior quantitatively. Without the complicated chemical reaction parameters, the incorporation probability is controlled by the effective concentrations of the group V atoms on the migration state. Only two parameters, As to P incorporation ratio and the conversion factor between the gas flux rate and the gas flow rate, exist in this model. Furthermore, the model can be expanded to the whole range of alloy compositions by adjusting the incorporation ratio only. It is found that the incorporation ratio strongly depends on the Ga-compositions in Ga xIn1-xAsyP1-y alloys
Keywords
III-V semiconductors; chemical beam epitaxial growth; gallium arsenide; gallium compounds; indium compounds; semiconductor growth; (100) InP substrate; 490 C; AsH3; GSMBE; GaxIn1-xAsyP1-y quaternary alloys; GaInAsP; InP; PH3; PH3-AsH3; chemical reaction parameters; conversion factor; gas flow rate; gas flow rate ratios; gas flux rate; gas source molecular beam epitaxy; group V incorporation behavior; growth model; growth temperature; incorporation probability; incorporation ratio; Atomic layer deposition; Chemical elements; Curve fitting; Equations; Fluid flow; Indium phosphide; Molecular beam epitaxial growth; Optoelectronic devices; Steady-state; Surface fitting;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on
Conference_Location
Hokkaido
Print_ISBN
0-7803-2147-2
Type
conf
DOI
10.1109/ICIPRM.1995.522108
Filename
522108
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