DocumentCode :
3132897
Title :
Performance analysis in modeling micro capacitive pressure sensor
Author :
Tsui, Chun-Shan
Author_Institution :
Pitotech, Changhua, Taiwan
fYear :
2009
fDate :
21-23 Oct. 2009
Firstpage :
39
Lastpage :
42
Abstract :
In this paper, a finite element numerical (FEM) simulation via COMSOL Multiphysics was carried out to study the performance of micro capacitive pressure sensor. At first stage, the effect of fabrication was considered. At second stage, calculating the relationship between capacitance and applied pressure under different operation condition, including bonding temperature, thermal expansion coefficient of silicon and thickness of pressurized compartment by using Taguchi Method. Finally, finding the best condition of fabrication and operation. The simulation showed that capacitance of the sensor was as the function of the operating pressure. The higher bonding temperature was fabricated, the lower capacitance can be achieved under the same applied load. And thinner thickness of the pressurized compartment provided good resolution. Thus, the performance of micro capacitive pressure sensor can be predicted with qualitative analysis and with quantitative analysis via numerical simulation.
Keywords :
Taguchi methods; capacitance; capacitive sensors; elemental semiconductors; finite element analysis; microsensors; pressure sensors; silicon; thermal expansion; COMSOL Multiphysics; Taguchi method; bonding temperature; capacitance; finite element numerical simulation; microcapacitive pressure sensor; performance analysis; pressurized compartment; quantitative analysis; thermal expansion coefficient; Bonding; Capacitance; Capacitive sensors; Fabrication; Finite element methods; Numerical simulation; Performance analysis; Silicon; Temperature sensors; Thermal expansion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-4341-3
Electronic_ISBN :
978-1-4244-4342-0
Type :
conf
DOI :
10.1109/IMPACT.2009.5382303
Filename :
5382303
Link To Document :
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