A concurrent BIST scheme for on-line/off-line testing based on a pre-computed test set

Manufacturing testing is carried-out once in order to ensure the correct operation of the circuit under test right after fabrication, while either periodic off-line testing or concurrent on-line testing is carried-out in order to ensure that the circuit under test continues to operate correctly in field. The utilization of input vector monitoring concurrent BIST techniques provides the capability to perform all types of testing, namely manufacturing, periodic off-line and concurrent on-line. The input vector monitoring concurrent BIST schemes proposed so far have targeted either exhaustive or pseudorandom testing. In this paper a novel input-vector monitoring concurrent BIST scheme based on a pre-computed test set is introduced. To the best of our knowledge, the proposed scheme is the first to be presented in the open literature based on a pre-computed test set that can perform both on line and off-line testing