• DocumentCode
    3133069
  • Title

    Fundamental study of 95 high-lead solder bump on substrates pre-soldered with eutectic PbSn

  • Author

    Chang, Chih-Chiang ; Lin, Chun-Cheng ; Kao, C. Robert

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    72
  • Lastpage
    75
  • Abstract
    This study investigated the intermixing of 95Pb5Sn solder bumps and 37Pb63Sn pre-solder in flip-chip solder joints. The reaction conditions included multiple reflows (up to 10) at 240°C, whereby previously solder-coated parts are joined by heating without using additional solder. We found that the molten pre-solder had an irregular shape similar to a calyx (i.e., a cuplike structure) wrapped around a high-lead solder bump. The height to which the molten pre-solder ascended along the solid high-lead solder bump increased with the number of reflows. The molten pre-solder was able to reach the UBM/95Pb5Sn interface after three to five reflows. The molten pre-solder at the UBM/95Pb5Sn interface generated two important phenomena: (1) the molten solder dewetted (i.e., flowed away from the soldered surface) along the UBM/95Pb5Sn interface, particularly when the number of reflows was high, and (2) the molten pre-solder transported Cu atoms to the UBM/95Pb5Sn interface, which in turn caused the Ni-Sn compounds at the chip-side interface to change into (Cu0.6Ni0.4)6Sn5.
  • Keywords
    eutectic alloys; flip-chip devices; lead alloys; soldering; tin alloys; PbSn; chip-side interface; flip-chip solder joints; high-lead solder bump; molten presolder; substrates presoldering; Flip chip solder joints; Heating; Shape; Solids; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382312
  • Filename
    5382312