DocumentCode :
3133163
Title :
Formation of High Resistivity Phases of Nickel Silicide at Small Diffusion Region
Author :
Tomita, Ryuji ; Kimura, Hiroshi ; Yasuda, Makoto ; Nakayama, Tomowo ; Maeda, Kazutaka ; Sugiyama, Yousuke ; Kikuchi, Yoshinori ; Moritoki, Masashige
Author_Institution :
NEC Electronics Corp., Sagamihara
fYear :
2007
fDate :
8-9 June 2007
Firstpage :
89
Lastpage :
92
Abstract :
An increase in the sheet resistance at small diffusion regions is caused by the formation of high resistivity phases of nickel silicide. The increase in the sheet resistance strongly depends on the size of diffusion region at which nickel silicide is formed. On the condition under which NiSi is formed at large diffusion regions, Ni3Si2 is formed at small N* diffusion regions and NiSi2 is formed at small N* diffusion regions. The uniformity of sheet resistance at small N* diffusion regions is improved by increasing the first anneal temperature. The uniformity of sheet resistance at small N* diffusion regions is not improved enough by increasing the first or second anneal temperature. It is considered that the transformation from Ni3Si2 to NiSi2 occurs at small N* diffusion region between 500degC and 550degC.
Keywords :
diffusion; electrical resistivity; nickel compounds; semiconductor-metal boundaries; solid-state phase transformations; CMOS process; Ni-Si - Interface; Ni3Si2; Si - Surface; anneal temperature; diffusion; high resistivity phases; sheet resistance; Annealing; Conductivity; Diffraction; Electronic equipment testing; Nickel; Silicidation; Silicides; Silicon; Temperature; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Junction Technology, 2007 International Workshop on
Conference_Location :
Kyoto
Print_ISBN :
1-4244-1103-3
Electronic_ISBN :
1-4244-1104-1
Type :
conf
DOI :
10.1109/IWJT.2007.4279956
Filename :
4279956
Link To Document :
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