DocumentCode
3133163
Title
Formation of High Resistivity Phases of Nickel Silicide at Small Diffusion Region
Author
Tomita, Ryuji ; Kimura, Hiroshi ; Yasuda, Makoto ; Nakayama, Tomowo ; Maeda, Kazutaka ; Sugiyama, Yousuke ; Kikuchi, Yoshinori ; Moritoki, Masashige
Author_Institution
NEC Electronics Corp., Sagamihara
fYear
2007
fDate
8-9 June 2007
Firstpage
89
Lastpage
92
Abstract
An increase in the sheet resistance at small diffusion regions is caused by the formation of high resistivity phases of nickel silicide. The increase in the sheet resistance strongly depends on the size of diffusion region at which nickel silicide is formed. On the condition under which NiSi is formed at large diffusion regions, Ni3Si2 is formed at small N* diffusion regions and NiSi2 is formed at small N* diffusion regions. The uniformity of sheet resistance at small N* diffusion regions is improved by increasing the first anneal temperature. The uniformity of sheet resistance at small N* diffusion regions is not improved enough by increasing the first or second anneal temperature. It is considered that the transformation from Ni3Si2 to NiSi2 occurs at small N* diffusion region between 500degC and 550degC.
Keywords
diffusion; electrical resistivity; nickel compounds; semiconductor-metal boundaries; solid-state phase transformations; CMOS process; Ni-Si - Interface; Ni3Si2; Si - Surface; anneal temperature; diffusion; high resistivity phases; sheet resistance; Annealing; Conductivity; Diffraction; Electronic equipment testing; Nickel; Silicidation; Silicides; Silicon; Temperature; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Junction Technology, 2007 International Workshop on
Conference_Location
Kyoto
Print_ISBN
1-4244-1103-3
Electronic_ISBN
1-4244-1104-1
Type
conf
DOI
10.1109/IWJT.2007.4279956
Filename
4279956
Link To Document