• DocumentCode
    3133163
  • Title

    Formation of High Resistivity Phases of Nickel Silicide at Small Diffusion Region

  • Author

    Tomita, Ryuji ; Kimura, Hiroshi ; Yasuda, Makoto ; Nakayama, Tomowo ; Maeda, Kazutaka ; Sugiyama, Yousuke ; Kikuchi, Yoshinori ; Moritoki, Masashige

  • Author_Institution
    NEC Electronics Corp., Sagamihara
  • fYear
    2007
  • fDate
    8-9 June 2007
  • Firstpage
    89
  • Lastpage
    92
  • Abstract
    An increase in the sheet resistance at small diffusion regions is caused by the formation of high resistivity phases of nickel silicide. The increase in the sheet resistance strongly depends on the size of diffusion region at which nickel silicide is formed. On the condition under which NiSi is formed at large diffusion regions, Ni3Si2 is formed at small N* diffusion regions and NiSi2 is formed at small N* diffusion regions. The uniformity of sheet resistance at small N* diffusion regions is improved by increasing the first anneal temperature. The uniformity of sheet resistance at small N* diffusion regions is not improved enough by increasing the first or second anneal temperature. It is considered that the transformation from Ni3Si2 to NiSi2 occurs at small N* diffusion region between 500degC and 550degC.
  • Keywords
    diffusion; electrical resistivity; nickel compounds; semiconductor-metal boundaries; solid-state phase transformations; CMOS process; Ni-Si - Interface; Ni3Si2; Si - Surface; anneal temperature; diffusion; high resistivity phases; sheet resistance; Annealing; Conductivity; Diffraction; Electronic equipment testing; Nickel; Silicidation; Silicides; Silicon; Temperature; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Junction Technology, 2007 International Workshop on
  • Conference_Location
    Kyoto
  • Print_ISBN
    1-4244-1103-3
  • Electronic_ISBN
    1-4244-1104-1
  • Type

    conf

  • DOI
    10.1109/IWJT.2007.4279956
  • Filename
    4279956