• DocumentCode
    3133207
  • Title

    How are we going to test SOC´s on a board?

  • Author

    Smith, Michael J.

  • Author_Institution
    Teradyne Inc., Boston, MA
  • fYear
    2005
  • fDate
    8-8 Nov. 2005
  • Lastpage
    1267
  • Abstract
    This abstract discusses how the testing of SOC´s on boards can be addressed in the current manufacturing test environment
  • Keywords
    printed circuit manufacture; printed circuit testing; production testing; system-on-chip; SOC; manufacturing test environment; on board test; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2005. Proceedings. ITC 2005. IEEE International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-9038-5
  • Type

    conf

  • DOI
    10.1109/TEST.2005.1584099
  • Filename
    1584099
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3133207