DocumentCode
3133253
Title
Is the concern for soft-error overblown?
Author
Raina, Rajesh
Author_Institution
Freescale Semicond., Austin, TX, USA
fYear
2005
fDate
8-10 Nov. 2005
Abstract
This article gives a general perspective regarding soft error and how to deal with it. Finally it the author gives his position on issues in solving soft error problems.
Keywords
integrated circuit reliability; radiation hardening (electronics); IC soft-error detection; radiation hardening; Alpha particles; Atmosphere; Cellular phones; Electronics industry; Energy states; Humans; Moore´s Law; Neutrons; TV; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1584103
Filename
1584103
Link To Document