Title :
Co-validation environment for memory card compatibility test: a case study
Author :
Park, Chanik ; Cho, Seungmo ; Lee, Jaewook ; Park, Hyungjun
Author_Institution :
Samsung Electron. Co., Ltd. South Korea
Abstract :
As diverse memory cards based on NAND flash memory are getting popularity with consumer electronics such as digital camera, camcorder and MP3 player, the compatibility problems between a newly developed memory card and existent host systems have become a main obstacle to time-to-market delivery of product. The common practice for memory card compatibility test is to use a real host system as a test bed. As an improved solution, an FPGA-based prototyping board can be used for emulating host systems. However, the above approaches require a long set-up time and have limitations in representing various host and device systems. In this paper, we propose a co-validation environment for compatibility test between memory card and host system using formal modeling based on Esterel language and co-simulation methodology. Finally, we demonstrate the usefulness of the proposed environment with a case study of real memory card development.
Keywords :
benchmark testing; field programmable gate arrays; flash memories; memory cards; simulation; specification languages; time to market; Esterel language; FPGA-based prototyping; MP3 player; NAND flash memory; camcorder; compatibility test; consumer electronics; cosimulation methodology; covalidation environment; digital camera; formal modeling; memory card; real host system; time-to-market product delivery; Computer aided software engineering; Consumer electronics; Digital audio players; Digital cameras; Electronic equipment testing; Memory; Power system reliability; System testing; Time to market; Video equipment;
Conference_Titel :
Rapid System Prototyping, 2004. Proceedings. 15th IEEE International Workshop on
Print_ISBN :
0-7695-2159-2
DOI :
10.1109/IWRSP.2004.1311096