Title :
Have we overcome the challenges associated with SoC and multi-core testing?
Author_Institution :
Freescale Semicond., Austin, TX
Abstract :
Today, the best way to overcome the challenges associated with SoC and multi-core testing is by avoiding them. This position statement argues how avoiding the challenges are actually good for the growth of SoC business
Keywords :
integrated circuit testing; system-on-chip; SoC testing; multicore testing; system-on-chip; Circuit testing; Clocks; Face detection; Frequency domain analysis; Logic testing; Manufacturing; Multicore processing; System testing; System-on-a-chip; Voltage;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584116
