DocumentCode
3133429
Title
Have we overcome the challenges associated with SoC and multi-core testing?
Author
Raina, R.
Author_Institution
Freescale Semicond., Austin, TX
fYear
2005
fDate
8-8 Nov. 2005
Lastpage
1295
Abstract
Today, the best way to overcome the challenges associated with SoC and multi-core testing is by avoiding them. This position statement argues how avoiding the challenges are actually good for the growth of SoC business
Keywords
integrated circuit testing; system-on-chip; SoC testing; multicore testing; system-on-chip; Circuit testing; Clocks; Face detection; Frequency domain analysis; Logic testing; Manufacturing; Multicore processing; System testing; System-on-a-chip; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location
Austin, TX
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1584116
Filename
1584116
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