• DocumentCode
    3133508
  • Title

    Improved selective growth of InP around dry-etched mesas by LP-MOCVD at low growth temperature

  • Author

    Takemi, M. ; Kimura, T. ; Miura, T. ; Mihashi, Y. ; Takamiya, S.

  • Author_Institution
    Optoelectron. & Microwave Devices R&D Lab., Mitsubishi Electr. Corp., Hyogo, Japan
  • fYear
    1995
  • fDate
    9-13 May 1995
  • Firstpage
    333
  • Lastpage
    336
  • Abstract
    We applied a high-speed rotating-disk MOCVD reactor to the selective embedding growth around the mesas formed by reactive ion etching (RIE), and investigated the growth conditions which give planar embedding around the mesas. It is shown that almost planar embedding growth can be achieved even at low growth temperature without introducing any chlorine compounds. Moreover, we discuss the effects of dopants on the behaviors in the selective embedding growth. Special attention has been focused on the growth on the side walls of the nearly-rectangular mesas as well as that near the edges of the masks
  • Keywords
    III-V semiconductors; indium compounds; semiconductor doping; semiconductor growth; sputter etching; vapour phase epitaxial growth; 50 to 150 torr; 580 to 660 degC; InP; LP-MOCVD; dopant effects; dry-etched mesas; growth conditions; high-speed rotating-disk MOCVD reactor; improved selective growth; low growth temperature; nearly-rectangular mesas; planar embedding; reactive ion etching; selective embedding growth; side walls; Chemical lasers; Chemical vapor deposition; Diode lasers; Indium phosphide; Inductors; MOCVD; Microwave devices; Microwave theory and techniques; Scanning electron microscopy; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on
  • Conference_Location
    Hokkaido
  • Print_ISBN
    0-7803-2147-2
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1995.522147
  • Filename
    522147