DocumentCode
3133508
Title
Improved selective growth of InP around dry-etched mesas by LP-MOCVD at low growth temperature
Author
Takemi, M. ; Kimura, T. ; Miura, T. ; Mihashi, Y. ; Takamiya, S.
Author_Institution
Optoelectron. & Microwave Devices R&D Lab., Mitsubishi Electr. Corp., Hyogo, Japan
fYear
1995
fDate
9-13 May 1995
Firstpage
333
Lastpage
336
Abstract
We applied a high-speed rotating-disk MOCVD reactor to the selective embedding growth around the mesas formed by reactive ion etching (RIE), and investigated the growth conditions which give planar embedding around the mesas. It is shown that almost planar embedding growth can be achieved even at low growth temperature without introducing any chlorine compounds. Moreover, we discuss the effects of dopants on the behaviors in the selective embedding growth. Special attention has been focused on the growth on the side walls of the nearly-rectangular mesas as well as that near the edges of the masks
Keywords
III-V semiconductors; indium compounds; semiconductor doping; semiconductor growth; sputter etching; vapour phase epitaxial growth; 50 to 150 torr; 580 to 660 degC; InP; LP-MOCVD; dopant effects; dry-etched mesas; growth conditions; high-speed rotating-disk MOCVD reactor; improved selective growth; low growth temperature; nearly-rectangular mesas; planar embedding; reactive ion etching; selective embedding growth; side walls; Chemical lasers; Chemical vapor deposition; Diode lasers; Indium phosphide; Inductors; MOCVD; Microwave devices; Microwave theory and techniques; Scanning electron microscopy; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on
Conference_Location
Hokkaido
Print_ISBN
0-7803-2147-2
Type
conf
DOI
10.1109/ICIPRM.1995.522147
Filename
522147
Link To Document