Darwin, thy name is system

Combine a hint of fear, a sense of foreboding and a thirst for self-preservation with the necessity to keep pace with rapidly increasing capabilities and complexities of the semiconductor manufacturing process and you have the perfect recipe for provoking an explosive evolutionary leap of design and test practices. Are we poised at a critical point of divergence from tradition and convention? Is there a developmental path which at once decreases new product time-to-market, time-to-full yield entitlement and production test costs, while simultaneously increasing yields, product quality levels and engineering reuse? Darwin, thy name is system