Title :
Guaranteed by design or guaranteed to fail or guaranteed by test? or ... neither?
Author_Institution :
Washington Univ., Seattle, WA
Abstract :
The interaction between design and test is a matter of great importance in high-speed RF product development. In this paper, the guaranteed-by-design concept was evaluated. The quest for "guaranteed by design" increasingly runs into obstacles for various reasons
Keywords :
integrated circuit design; integrated circuit testing; product development; guaranteed-by-design concept; high-speed RF product development; product testing; Algorithm design and analysis; Circuit simulation; Costs; Fabrication; Manufacturing processes; Predictive models; Product development; Radio frequency; Solid modeling; Testing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584124
