Title :
Correct by construction is guaranteed to fail
Author_Institution :
LogicVision, San Jose, CA
Abstract :
In conclusion, correct-by-construction design must be augmented with design-for-test that permits diagnostic, parametric, production tests so that parametric margin can be continuously monitored during production and in the end application. Otherwise, "correct-by-construction" devices are guaranteed to fail at the most inconvenient time
Keywords :
design for testability; correct-by-construction design; design for testability; diagnostic tests; parametric tests; production tests; Built-in self-test; Circuit faults; Circuit noise; Circuit testing; Design methodology; Error correction codes; Jitter; Logic testing; Production; Signal design;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584125
