DocumentCode
3133550
Title
Correct by construction is guaranteed to fail
Author
Sunter, Stephen
Author_Institution
LogicVision, San Jose, CA
fYear
2005
fDate
8-8 Nov. 2005
Lastpage
1308
Abstract
In conclusion, correct-by-construction design must be augmented with design-for-test that permits diagnostic, parametric, production tests so that parametric margin can be continuously monitored during production and in the end application. Otherwise, "correct-by-construction" devices are guaranteed to fail at the most inconvenient time
Keywords
design for testability; correct-by-construction design; design for testability; diagnostic tests; parametric tests; production tests; Built-in self-test; Circuit faults; Circuit noise; Circuit testing; Design methodology; Error correction codes; Jitter; Logic testing; Production; Signal design;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location
Austin, TX
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1584125
Filename
1584125
Link To Document