DocumentCode
3133572
Title
Needs fabless yield ramp foundry partnership to be most successful
Author
Cory, Bruce
Author_Institution
NVIDIA, Santa Clara, CA
fYear
2005
fDate
8-8 Nov. 2005
Lastpage
1310
Abstract
Using all available data to triangulate on problems becomes more complicated in the fabless model due to competitive issues. Further complication is added because more and more fabless companies are starting to have a slightly different prioritization of defect issues then just best impacting overall defect density. Solving these main issues requires strong partnership while respecting the competitive requirements of both the foundry and the fabless company
Keywords
application specific integrated circuits; design for manufacture; integrated circuit design; integrated circuit manufacture; integrated circuit yield; IC design-for-manufacturing; fabless model; yield enhancement; Databases; Foundries; Target tracking; Weapons;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location
Austin, TX
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1584127
Filename
1584127
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