DocumentCode
3133884
Title
Biodegradation of Higher Concentration Phenol by Pseudomonas aeruginosa HS-D38
Author
Zheng, Yongliang ; Gan, Jianping ; Xiang, Jun ; Fang, Yuanping ; Liu, Deli ; Fang, Jianping
Author_Institution
Coll. of Life Sci. & Eng., Huanggang Normal Univ., Huangzhou, China
fYear
2010
fDate
18-20 June 2010
Firstpage
1
Lastpage
4
Abstract
Phenol is an important and common environmental pollutant. In this study, Pseudomonas aeruginosa HS-D38 strain was used to degrade phenol, and the degradation characteristics were investigated. Results indicated that HS-D38 strain could degrade phenol and utilize it as the sole carbon, nitrogen and energy source. UV-visible spectra analysis showed that 300 mgL-1 phenols could be completely degraded within 10 h by HS-D38 strain after an initial lag phase of 2 h, and the peak decreased gradually with the degradation of phenol by HS-D38. At the same time, an increase of OD600 values in the culture was also observed. Phenol could be mineralized at higher concentration of 500 mgL-1 by HS-D38 strain, whereas the degradation did not occur when the concentration was exceeded 700 mgL-1 even after 72 h. A key intermediate was detected analyzing the degradation solution with HPLC and it was identified to p-hydroxybenzoic acid. The peaks disappeared after 15 h indicating intermediates were also degraded by HS-D38 strain and the metabolism proceeded through the p-hydroxybenzoic acid pathway.
Keywords
environmental degradation; microorganisms; organic compounds; ultraviolet spectra; visible spectra; wastewater treatment; Pseudomonas aeruginosa HS-D38 strain; UV-visible spectra analysis; biodegradation; environmental pollutant; p-hydroxybenzoic acid; phenols; Biodegradation; Capacitive sensors; Chemical industry; Degradation; Educational institutions; Metals industry; Microorganisms; Mineralization; Mining industry; Pollution;
fLanguage
English
Publisher
ieee
Conference_Titel
Bioinformatics and Biomedical Engineering (iCBBE), 2010 4th International Conference on
Conference_Location
Chengdu
ISSN
2151-7614
Print_ISBN
978-1-4244-4712-1
Electronic_ISBN
2151-7614
Type
conf
DOI
10.1109/ICBBE.2010.5517102
Filename
5517102
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