Title :
An efficient analysis of microstrip lines on artificial periodic structures
Author :
Sheng, X.Q. ; Yung, E.K.N. ; Chan, C.H.
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, China
Abstract :
In this paper a hybrid numerical approach is designed for microstrip lines on artificial periodic structures. This hybrid approach divides the whole transmission problem of periodic microstrip structures into two problems: the eigenmode problem in the transverse direction, and the reflection and transmission problem in the longitudinal direction. The eigenmode problem of uniform transmission lines is analyzed by the edge-based finite element method, and the reflection and transmission of the discontinuity in the longitudinal direction are calculated by the mode-matching method and the multimode network theory. Numerical experiments demonstrate the accuracy, efficiency, and generality of this hybrid approach. Various numerical results are given for both infinite and finite periodic microstrip structures
Keywords :
eigenvalues and eigenfunctions; electromagnetic wave reflection; electromagnetic wave transmission; finite element analysis; microstrip discontinuities; microstrip lines; mode matching; periodic structures; transmission line theory; artificial periodic structures; discontinuity; edge-based finite element method; eigenmode problem; finite periodic microstrip structures; hybrid numerical approach; infinite periodic microstrip structures; longitudinal direction; microstrip lines; mode-matching method; multimode network theory; numerical experiments; periodic microstrip structures; reflection problem; transmission problem; transverse direction; uniform transmission lines; Finite difference methods; Finite element methods; Microstrip; Microwave circuits; Mode matching methods; Optical reflection; Periodic structures; Time domain analysis; Transmission line discontinuities; Transmission line theory;
Conference_Titel :
Microwave Conference, 2000 Asia-Pacific
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6435-X
DOI :
10.1109/APMC.2000.925832