Title :
Applying multi-channel sampling to one-comparator counter-based sampling to enhance system robustness
Author :
Hwu, K.I. ; Yau, Y.T.
Author_Institution :
Dept. of Electr. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan
Abstract :
In this paper, the proposed multi-channel sampling technique is applied to the one-comparator counter-based sampling so as to make the system more robust than ever. Without changing any circuit structure, this is experimentally demonstrated by some gain margins of Bode plots.
Keywords :
Bode diagrams; analogue-digital conversion; comparators (circuits); Bode plots; circuit structure; multichannel sampling; one-comparator counter-based sampling; system robustness; Delay lines; Field programmable gate arrays; Frequency; Logic devices; Operational amplifiers; Robustness; Sampling methods; Signal sampling; Voltage; Voltage-controlled oscillators; counter-based; multi-channel sampling; one-comparator; robustness;
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
Conference_Location :
Taichung
Print_ISBN :
978-1-4244-5045-9
Electronic_ISBN :
978-1-4244-5046-6
DOI :
10.1109/ICIEA.2010.5517108
