DocumentCode
3134216
Title
Photopumped operation of dry etched λ=1.5 μm vertical cavity surface emitting lasers
Author
Streubel, K. ; André, J. ; Lourdudoss, S. ; Karlsson, A. ; Heide, T.
Author_Institution
Dept. of Electron., R. Inst. of Technol., Kista, Sweden
fYear
1995
fDate
9-13 May 1995
Firstpage
464
Lastpage
467
Abstract
We report on the fabrication of VCSEL mesas for 1.5 μm operation. The single lasers were separated by reactive ion etching (RIE) and 12 μm high mesas with diameters ranging from 3 to 100 μm were formed. The performance of the devices was studied as a function of their size. Photopumped RT-lasing operation of free standing micropost VCSELs was demonstrated, even when using the rather long pulses of a Q-switched YAG laser. The equivalent threshold current density increases with the mesa diameter as a consequence of the difficult heat dissipation in the thin posts. RT operation was achieved with 5 μm diameter free standing mesas (80 ps pulses) and 3 μm wide regrown mesas (250 ns pulses). The quantum well laser showed a very low threshold power of 360 W/cm2 (450 kA/cm2). The transverse modes structure was discriminated as TEM00, TEM 11, TEM20 and TEM10. Typically 4-5 transverse modes were observed on 30-100 μm diameter mesas. The threshold increases in the range between -10 and 60 °C with a characteristic temperature around 45 K. Several lasers operated up to 80 °C
Keywords
distributed Bragg reflector lasers; laser modes; laser transitions; optical pumping; quantum well lasers; sputter etching; surface emitting lasers; -10 to 60 degC; 1.5 mum; 12 mum; 250 ns; 3 mum; 3 to 100 mum; 30 to 100 mum; 5 mum; 80 degC; 80 ps; InP; Q-switched YAG laser pulses; RT operation; VCSEL mesas; dry etched vertical cavity surface emitting lasers; equivalent threshold current density; fabrication; free standing mesas; free standing micropost VCSEL; heat dissipation; mesa diameter; performance; photopumped RT-lasing operation; photopumped operation; quantum well laser; reactive ion etching; regrown mesas; single lasers; size; transverse modes structure; very low threshold power; Dry etching; Epitaxial growth; Indium phosphide; Laser excitation; Laser mode locking; Mirrors; Optical pumping; Pump lasers; Sputter etching; Threshold current;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on
Conference_Location
Hokkaido
Print_ISBN
0-7803-2147-2
Type
conf
DOI
10.1109/ICIPRM.1995.522180
Filename
522180
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