• DocumentCode
    3134285
  • Title

    A Two-Level Caching Mechanism for Demand-Based Page-Level Address Mapping in NAND Flash Memory Storage Systems

  • Author

    Qin, Zhiwei ; Wang, Yi ; Liu, Duo ; Shao, Zili

  • Author_Institution
    Dept. of Comput., Hong Kong Polytech. Univ., Kowloon, China
  • fYear
    2011
  • fDate
    11-14 April 2011
  • Firstpage
    157
  • Lastpage
    166
  • Abstract
    The increasing capacity of NAND flash memory leads to large RAM footprint on address mapping in the Flash Translation Layer (FTL) design. The demand-based approach can reduce the RAM footprint, but extra address translation overhead is also introduced which may degrade the system performance. This paper proposes a two-level caching mechanism to selectively cache the on-demand page-level address mappings by jointly exploiting the temporal locality and the spatial locality of workloads. The objective is to improve the cache hit ratio so as to shorten the system response time and reduce the block erase counts for NAND flash memory storage systems. By exploring the optimized temporal-spatial cache configurations, our technique can well capture the reference locality in workloads so that the hit ratio can be improved. Experimental results show that our technique can achieve a 31.51% improvement in hit ratio, which leads to a 31.11% reduction in average system response time and a 50.83% reduction in block erase counts compared with the previous work.
  • Keywords
    NAND circuits; cache storage; flash memories; storage allocation; NAND flash memory storage systems; RAM footprint; block erase counts; demand-based page-level address mapping; extra address translation overhead; flash translation layer design; on-demand page-level address mappings; temporal-spatial cache configurations; two-level caching mechanism; Algorithm design and analysis; Ash; Computer architecture; Flash memory; Random access memory; System performance; Time factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Real-Time and Embedded Technology and Applications Symposium (RTAS), 2011 17th IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1080-1812
  • Print_ISBN
    978-1-61284-326-1
  • Type

    conf

  • DOI
    10.1109/RTAS.2011.23
  • Filename
    5767148