• DocumentCode
    3134726
  • Title

    Corrosion management for data centers

  • Author

    Klein, L.J. ; Singh, P.J. ; Schappert, M. ; Griffel, Marc ; Hamann, H.F.

  • Author_Institution
    IBM TJ Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2011
  • fDate
    20-24 March 2011
  • Firstpage
    21
  • Lastpage
    26
  • Abstract
    The recent interest in air-side cooling and the spread of data centers into geographies with higher levels of atmospheric contamination is requiring more attention towards air quality management in data centers. One concern of air side economization is an increase in contamination levels potentially leading to more failures and outages of the IT equipment. In this paper we describe a corrosion measurement and management technology that enables high accuracy and real time monitoring of the gaseous contamination. The synergistic effects of indoor air temperature and relative humidity on corrosion rates are investigated and the spatial and the temporal variations of the corrosivity are established. Filtering of the outside air, both for particulate and gaseous contamination can mitigate air contamination in data centers. Implementing a facility wide air quality monitoring system promises the safe use of air-side economizers and would establish appropriate filtering, which enable early prevention of critical situations for information technology (IT) equipment operations.
  • Keywords
    air pollution control; computer centres; contamination; corrosion; filtration; monitoring; air contamination mitigation; air quality monitoring system; air-side economizers; atmospheric contamination; corrosion management; corrosion measurement; corrosion rates; corrosivity; data centers; filtering; gaseous contamination monitoring; indoor air temperature; information technology equipment operation; particulate contamination; relative humidity; corrosion; data center; dew point; relative humidity; risk management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-61284-740-5
  • Type

    conf

  • DOI
    10.1109/STHERM.2011.5767173
  • Filename
    5767173