DocumentCode
3134765
Title
Optimal heat transfer performance of the microfluidic electrospray cooling devices
Author
Wang, Hsiu-Che ; Mamishev, Alexander V.
Author_Institution
Univ. of Washington, Seattle, WA, USA
fYear
2011
fDate
20-24 March 2011
Firstpage
35
Lastpage
42
Abstract
Future thermal management of microelectronics demands high heat flux removal capabilities due to rapid increases in component and heat flux densities generated from integrated circuits (ICs). Although electrospray evaporative cooling (ESEC) has been investigated as the potential package-level thermal management solution for future microelectronics, the optimal heat transfer performance of ESEC devices using a different number of nozzles has not been thoroughly investigated as a whole. This paper presents three different kinds of ESEC chambers with different spacing, in order to investigate their optimal heat transfer performances. The maximum enhancement ratio of 1.87 was achieved by the 8-nozzle 5 mm spacing ESEC chamber at the lowest heat flux. The optimal heat transfer performance for the 4-nozzle chamber is the chamber with 6 mm spacing. Both the 8-nozzle 5 mm spacing ESEC chamber and the 8-nozzle 6 mm spacing ESEC chamber achieve optimal heat transfer performance. Furthermore, although the increase in the number of electrospray nozzles of the ESEC chambers does not provide obvious improvement on the maximum achievable heat transfer enhancement ratio, the highest cooling rate is noticeably enhanced by increasing the number of electrospray nozzles of the ESEC chamber.
Keywords
cooling; microfluidics; thermal management (packaging); cooling rate; electrospray evaporative cooling; electrospray nozzles; heat flux removal capabilities; heat transfer; microelectronics; microfluidic electrospray cooling devices; package-level thermal management; Cooling; Fluids; Heat transfer; Microfluidics; Resistance heating; Temperature measurement; Electrospray; geometry; microfluidic chamber; micronozzle;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-61284-740-5
Type
conf
DOI
10.1109/STHERM.2011.5767175
Filename
5767175
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