DocumentCode
3135053
Title
Facial feature localization usingweighted vector concentration approach
Author
Kozakaya, Tatsuo ; Shibata, Tomoyuki ; Yuasa, Mayumi ; Yamaguchi, Osamu
Author_Institution
Corp. Res. & Dev. Center, Toshiba Corp., Kawasaki
fYear
2008
fDate
17-19 Sept. 2008
Firstpage
1
Lastpage
6
Abstract
In this paper, we propose an efficient and generic facial feature localization method based on a weighted vector concentration approach. Our method does not require any specific priors on facial shape but implicitly learns its structural information from a training data. Unlike previous work, facial feature points are globally estimated by the concentration of directional vectors from sampling points on a face region, and those vectors are weighted by using local likelihood patterns which discriminate the appropriate position of the feature points. The directional vectors and local likelihood patterns are provided through nearest neighbor search between local patterns around the sampling points and a trained codebook of extended templates. The combination of the global vector concentration and the verification with the local likelihood patterns achieves robust facial feature point detection. We demonstrate that our method outperforms state-of-the-art method based on the Active Shape Models in our evaluation.
Keywords
computational geometry; face recognition; feature extraction; image sampling; learning (artificial intelligence); search problems; vectors; AdaBoost approach; face detection; face region sampling point; facial feature localization; facial feature point detection; facial shape; global geometric information; local likelihood pattern; nearest neighbor search; trained codebook; weighted vector concentration approach; Active appearance model; Active shape model; Face detection; Face recognition; Facial features; Nearest neighbor searches; Robustness; Sampling methods; Ultrasonic imaging; Virtual colonoscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Automatic Face & Gesture Recognition, 2008. FG '08. 8th IEEE International Conference on
Conference_Location
Amsterdam
Print_ISBN
978-1-4244-2153-4
Electronic_ISBN
978-1-4244-2154-1
Type
conf
DOI
10.1109/AFGR.2008.4813360
Filename
4813360
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