Title :
An equivalent circuit with the physical structure of depletion region considered for determination the parasitic capacitances of MESFETs and HEMTs
Author :
Lim, Jong-Sik ; Kim, Byung-Sung ; Nam, Sangwook
Author_Institution :
Dept. of Electr. Eng., Seoul Nat. Univ., South Korea
Abstract :
An improved equivalent circuit model for GaAs MESFETs and HEMTs under zero drain bias and pinch-off is proposed. The presented method utilizes the physical structure of the depletion region under the gate in channel. Under the bias of pinch off at Vds=0V, the depletion region where internal fringing capacitances exist looks like a fiat box (hexahedron). Using the basic equation of parallel plate capacitors, the parasitic capacitances of MESFET and HEMT with the physical dimension of depletion region considered are calculated from the measured S-parameters under the pinched-off coldFET measurement
Keywords :
III-V semiconductors; S-parameters; Schottky gate field effect transistors; capacitance; equivalent circuits; gallium arsenide; high electron mobility transistors; microwave field effect transistors; millimetre wave field effect transistors; semiconductor device models; GaAs; GaAs HEMTs; GaAs MESFETs; S-parameters; depletion region physical structure; equivalent circuit model; internal fringing capacitances; parallel plate capacitor equation; parasitic capacitances; pinch-off; pinchedoff coldFET measurement; zero drain bias; Capacitance measurement; Capacitors; Equations; Equivalent circuits; Gallium arsenide; HEMTs; MESFETs; MODFETs; Parasitic capacitance; Scattering parameters;
Conference_Titel :
Microwave Conference, 2000 Asia-Pacific
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6435-X
DOI :
10.1109/APMC.2000.925965