• DocumentCode
    3135591
  • Title

    Development of an advanced thermal interface material for high power devices

  • Author

    Nguyen, My ; Brandi, Jason

  • Author_Institution
    Henkel Corp., Irvine, CA, USA
  • fYear
    2011
  • fDate
    20-24 March 2011
  • Firstpage
    333
  • Lastpage
    336
  • Abstract
    The cure reactions for conventional flexible epoxy resins are generally slow and have out-gassing and branching site reactions. As a result, these resin types have significant hardening after long-term, high-temperature exposure which makes them unsuitable for thermal interface applications. To address these challenges, a new epoxy resin system has been developed for thermal interface materials (TIMs). The main characteristics of the new resin are: - High thermal stability - No branching - Hydrophobic - Stable at room temperature Development and characterization of a new type of TIM will be discussed.
  • Keywords
    resins; thermal stability; advanced thermal interface material; cure reaction; flexible epoxy resin; high power device; high temperature exposure; high thermal stability; thermal interface application; Resins; Thermal conductivity; Thermal degradation; Thermal resistance; Thermal stability; TIM1; Thermal Interface; epoxy gel; flip-chip BGA; solder;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-61284-740-5
  • Type

    conf

  • DOI
    10.1109/STHERM.2011.5767220
  • Filename
    5767220