DocumentCode :
3135615
Title :
Notes
fYear :
2011
fDate :
20-24 March 2011
Firstpage :
1
Lastpage :
1
Abstract :
This page or pages intended for user notes.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
Conference_Location :
San Jose, CA
ISSN :
1065-2221
Print_ISBN :
978-1-61284-740-5
Type :
conf
DOI :
10.1109/STHERM.2011.5767221
Filename :
5767221
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3135615
