DocumentCode
3135630
Title
[Back cover]
fYear
2011
fDate
20-24 March 2011
Abstract
Presents the back cover of the proceedings.
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-61284-740-5
Type
conf
DOI
10.1109/STHERM.2011.5767223
Filename
5767223
Link To Document