DocumentCode
3135647
Title
Design considerations relating to non-thermal aspects of passive 2-phase immersion cooling
Author
Tuma, Phillip E.
Author_Institution
3M Center, 3M Co., St. Paul, MN, USA
fYear
2011
fDate
20-24 March 2011
Firstpage
1
Lastpage
9
Abstract
There is renewed interest in passive 2-phase immersion for cooling power electronics and high performance computers. This can be attributed to recent research showing its performance potential compared with more complex and costly techniques, to innovations that simplify its application and to a general trend toward higher power densities. Though the thermal performance capabilities of passive 2-phase immersion cooling are well documented, the technique is not widely practiced and system designers will find little published information concerning subtler and very critical aspects of system design. There is no manual, for example, concerning practical details like material compatibility, electrical signal integrity (SI), fluid decomposition, management of moisture and light gases, and so on. This paper presents a useful material compatibility test method and explains the mechanisms of distillation and extraction that are intrinsic to a refluxing 2-phase system and by which wetted materials interact with the fluid and each other. It discusses sources, implications and techniques for removal of organic contaminants, water, non-condensable air and fluid thermal decomposition products. Data are presented from sub-20 GHz SI experiments conducted with backplane connectors and microstrip transmission lines submerged in two classes of environmentally sustainable working fluids. It is hoped that this overview will demystify these subjects for designers unfamiliar with passive 2-phase immersion cooling and encourage more widespread adoption of this elegant and proven technology.
Keywords
cooling; electric connectors; microstrip lines; power electronics; thyristors; transmission lines; backplane connectors; electrical signal integrity; fluid decomposition; fluid thermal decomposition products; gate-turn-off thyristors; light gases; material compatibility test method; microstrip transmission lines; moisture management; organic contaminants; passive 2-phase immersion cooling; power density; power electronic cooling; system design; Fluids; Hoses; Immersion cooling; Insertion loss; Structural rings; 2-phase; cooling; data center; exascale; fluoroketone; hydrofluoroether; immersion; open bath; passive;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-61284-740-5
Type
conf
DOI
10.1109/STHERM.2011.5767224
Filename
5767224
Link To Document