• DocumentCode
    3136045
  • Title

    Regularized active shape model for shape alignment

  • Author

    He, Ran ; Lei, Zhen ; Yuan, Xiaotong ; Li, Stan Z.

  • Author_Institution
    Inst. of Autom., Chinese Acad. of Sci., Beijing
  • fYear
    2008
  • fDate
    17-19 Sept. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Active shape model (ASM) statistically represents a shape by a set of well-defined landmark points and models object variations using principal component analysis (PCA). However, the extracted shape contour modeled by PCA is still unsmooth when the shape has a large variation compared with the mean shape. In this paper, we propose a regularized ASM (R-ASM) model for shape alignment. During training stage, we present a regularized shape subspace on which image smoothness constraint is imposed, such that the learned components to model shape variations should not only minimize reconstruction error but also obey smoothness principle. During searching stage, a coarse-to-fine parameter adjustment strategy is performed under Bayesian inference. It makes a desired shape smoother and more robust to local noise. Lastly, an inner shape is introduced to further regularize search results. Experiments on face alignment demonstrate the efficiency and effectiveness of our proposed approach.
  • Keywords
    Bayes methods; edge detection; image reconstruction; learning (artificial intelligence); principal component analysis; shape recognition; Bayesian inference; PCA; contour extraction; face alignment; image reconstruction; image smoothness constraint; machine learning; parameter adjustment strategy; principal component analysis; regularized active shape model; shape alignment; Active shape model; Bayesian methods; Eigenvalues and eigenfunctions; Image analysis; Image reconstruction; Noise robustness; Noise shaping; Parameter estimation; Principal component analysis; Subspace constraints;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automatic Face & Gesture Recognition, 2008. FG '08. 8th IEEE International Conference on
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-1-4244-2153-4
  • Electronic_ISBN
    978-1-4244-2154-1
  • Type

    conf

  • DOI
    10.1109/AFGR.2008.4813423
  • Filename
    4813423