Title :
Error analysis for optimal design of accelerated tests (electromigration)
Author :
Hannaman, D.J. ; Zamani, N. ; Dhiman, J. ; Buehler, M.G.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
In accelerated life testing the operating life of a device is determined by extrapolation from the failure data at a set of stress points. A methodology for selecting an optimal set of stress points given a constraint in available test time is discussed. The approach is based on linearizing the failure equation and applying multiple linear regression to obtain the optimal stress points. Specific application is made to Black´s model (1982) of electromigration.<>
Keywords :
electromigration; error analysis; failure analysis; life testing; linearisation techniques; semiconductor device testing; Black model; VLSI device testing; accelerated life testing; electromigration; error analysis; extrapolation; failure data; failure equation; linearization; multiple linear regression; operating life; optimal design; optimal stress points; stress points; test time; Electromigration; Equations; Error analysis; Laboratories; Life estimation; Life testing; Linear regression; Propulsion; Stress; Uncertainty;
Conference_Titel :
Reliability Physics Symposium, 1990. 28th Annual Proceedings., International
Conference_Location :
New Orleans, LA, USA
DOI :
10.1109/RELPHY.1990.66062
