Error analysis for optimal design of accelerated tests (electromigration)

Author

Hannaman, D.J. ; Zamani, N. ; Dhiman, J. ; Buehler, M.G.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

fYear

1990

fDate

27-29 March 1990

Firstpage

55

Lastpage

60

Abstract

In accelerated life testing the operating life of a device is determined by extrapolation from the failure data at a set of stress points. A methodology for selecting an optimal set of stress points given a constraint in available test time is discussed. The approach is based on linearizing the failure equation and applying multiple linear regression to obtain the optimal stress points. Specific application is made to Black´s model (1982) of electromigration.<>

Keywords

electromigration; error analysis; failure analysis; life testing; linearisation techniques; semiconductor device testing; Black model; VLSI device testing; accelerated life testing; electromigration; error analysis; extrapolation; failure data; failure equation; linearization; multiple linear regression; operating life; optimal design; optimal stress points; stress points; test time; Electromigration; Equations; Error analysis; Laboratories; Life estimation; Life testing; Linear regression; Propulsion; Stress; Uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1990. 28th Annual Proceedings., International

Conference_Location

New Orleans, LA, USA

Type

conf

DOI

10.1109/RELPHY.1990.66062

Filename

66062