Title :
Analysis of P300 Classifiers in Brain Computer Interface Speller
Author :
Mirghasemi, H. ; Fazel-Rezai, R. ; Shamsollahi, M.B.
Author_Institution :
Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran
fDate :
Aug. 30 2006-Sept. 3 2006
Abstract :
In this paper, the performance of five classifiers in P300 speller paradigm are compared. Theses classifiers are Linear Support Vector Machine (LSVM), Gaussian Support Vector Machine (GSVM), Neural Network (NN), Fisher Linear Discriminant (FLD), and Kernel Fisher Discriminant (KFD). In classification of P300 waves, there has been a trend to use SVM classifiers. Although they have shown a good performance, in this paper, it is shown that the FLD classifiers outperform the SVM classifiers. FLD classifier uses only ten channels of the recorded electroencephalogram (EEG) signals. This makes them a very good candidate for real-time applications. In addition, FLD approach does not need any optimization similar to other methods. In addition, in this paper, it is shown that the efficiency of using Principal Component Analysis (PCA) for feature reduction results in decreasing the time for the classification and increasing the accuracy
Keywords :
electroencephalography; learning (artificial intelligence); medical signal processing; neural nets; principal component analysis; signal classification; support vector machines; user interfaces; EEG signal; FLD classifier; Fisher linear discriminant; Gaussian support vector machine GSVM; KFD; LSVM; P300 speller paradigm; PCA; brain computer interface; electroencephalogram; feature reduction; kernel Fisher discriminant; linear support vector machine; neural network; principal component analysis; Band pass filters; Brain computer interfaces; Cities and towns; Computer interfaces; Digital filters; Electroencephalography; Principal component analysis; Support vector machine classification; Support vector machines; USA Councils;
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2006.259521