• DocumentCode
    3136568
  • Title

    Avoiding the babbling idiot failure in a communication system based on flexible time division multiple access: A bus guardian solution

  • Author

    Wang, Kai ; Aidong, Xu ; Wang, Hong

  • Author_Institution
    Key Lab. of Ind. Inf., Chinese Acad. of Sci., Shenyang, China
  • fYear
    2009
  • fDate
    5-8 July 2009
  • Firstpage
    1292
  • Lastpage
    1297
  • Abstract
    In a safety-critical real time system it is important to prevent the babbling idiot failure (BIF), which is characterized by a faulty node transmitting arbitrary messages at random points in time. However, existing communication systems based on flexible time division multiple access (FTDMA), whose development was driven explicitly by the new needs of future in-car control applications involving safety-critical functions, do not provide any efficient solution to avoid the BIF. Therefore, a bus guardian (BG) solution is presented to avoid the BIF in a FTDMA based communication system in this paper. The supervision algorithm of the proposed BG is presented along with the node architecture necessary for implementing the presented technique. Results of performance evaluation show that the proposed BG can enforce the error containment in the time domain of FTDMA based systems and help to make them appropriate for safety-critical applications.
  • Keywords
    automobiles; mobile radio; real-time systems; safety systems; time division multiple access; FTDMA based communication system; babbling idiot failure avoidance; bus guardian solution; flexible time division multiple access; in-car control applications; safety-critical real time system; supervision algorithm; Automotive engineering; Broadcasting; Industrial electronics; Media Access Protocol; Physical layer; Protection; Real time systems; Time division multiple access; Topology; Vehicle dynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-4347-5
  • Electronic_ISBN
    978-1-4244-4349-9
  • Type

    conf

  • DOI
    10.1109/ISIE.2009.5222550
  • Filename
    5222550