Title :
Scalable load-balance measurement for SPMD codes
Author :
Gamblin, Todd ; De Supinski, Bronis R. ; Schulz, Martin ; Fowler, Rob ; Reed, Daniel A.
Author_Institution :
Renaissance Comput. Inst., Univ. of North Carolina at Chapel Hill, Chapel Hill, NC, USA
Abstract :
Good load balance is crucial on very large parallel systems, but the most sophisticated algorithms introduce dynamic imbalances through adaptation in domain decomposition or use of adaptive solvers. To observe and diagnose imbalance, developers need system-wide, temporally-ordered measurements from full-scale runs. This potentially requires data collection from multiple code regions on all processors over the entire execution. Doing this instrumentation naively can, in combination with the application itself, exceed available I/O bandwidth and storage capacity, and can induce severe behavioral perturbations. We present and evaluate a novel technique for scalable, low-error load balance measurement. This uses a parallel wavelet transform and other parallel encoding methods. We show that our technique collects and reconstructs system-wide measurements with low error. Compression time scales sublinearly with system size and data volume is several orders of magnitude smaller than the raw data. The overhead is low enough for online use in a production environment.
Keywords :
distributed memory systems; parallel algorithms; parallel programming; resource allocation; wavelet transforms; I/O bandwidth; SPMD code; large-scale distributed-memory parallel computer; parallel encoding method; parallel system; parallel wavelet transform; scalable load-balance measurement; single program multiple data; storage capacity; Adaptive algorithm; Encoding; Laboratories; Large-scale systems; Memory; Monitoring; Production; Signal processing; Time varying systems; Volume measurement;
Conference_Titel :
High Performance Computing, Networking, Storage and Analysis, 2008. SC 2008. International Conference for
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2834-2
Electronic_ISBN :
978-1-4244-2835-9
DOI :
10.1109/SC.2008.5222553