• DocumentCode
    3136674
  • Title

    Stable haptic interaction for AFM-based nanomanipulation

  • Author

    Lim, Yo-An ; Gyu Lee, Chang ; Kim, Jong-Phil ; Ryu, Jeha

  • Author_Institution
    Dept. of Mechatron., Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
  • fYear
    2009
  • fDate
    5-8 July 2009
  • Firstpage
    983
  • Lastpage
    988
  • Abstract
    This paper addresses stable haptic interaction for AFM (atomic force microscope)-based nanomanipulation. The EBA (energy-bounding algorithm), a passivity-based haptic control algorithm, is modified to include the scaling factors in the scaled bilateral teleoperation, and a commercial AFM is revised to be used as a nanomanipulation system with a 1-DOF custom-built haptic interface. Preliminary experiments show that the modified EBA can maintain stability during the interaction between an AFM probe and the surface of a sample for any force scaling factors.
  • Keywords
    atomic force microscopy; haptic interfaces; manipulators; nanotechnology; AFM; atomic force microscope-based nanomanipulation; energy-bounding algorithm; force scaling factors; haptic interaction; passivity-based haptic control algorithm; scaled bilateral teleoperation; scaling factors; Atomic force microscopy; Force control; Force feedback; Haptic interfaces; Humans; Nanoscale devices; Nanostructured materials; Paper technology; Probes; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-4347-5
  • Electronic_ISBN
    978-1-4244-4349-9
  • Type

    conf

  • DOI
    10.1109/ISIE.2009.5222558
  • Filename
    5222558