• DocumentCode
    3137115
  • Title

    A Low-Voltage Sampling Switch with Improved Linearity

  • Author

    Peng, Yunfeng ; Kong, Derui ; Zhou, Feng

  • Author_Institution
    ASIC & Syst. State Key Lab., Fudan Univ., Shanghai
  • fYear
    2006
  • fDate
    38838
  • Firstpage
    1706
  • Lastpage
    1709
  • Abstract
    A novel high linear sampling switch suitable for low-voltage operation is proposed. It not only eliminates the nonlinearity introduced by the gate-source voltage variation, but also reduces the nonlinearity resulting from the threshold voltage variation which is not solved in the earlier low-voltage sampling switch. This is achieved by adopting a replica transistor which has the same threshold voltage as the sampling transistor. The effectiveness of this technique has been demonstrated by a prototype design of a sampling switch in 0.35 mum. Simulations show that the sampling switch has a more constant on-conductance and a significant higher SFDR. This method is especially useful for low-voltage, high resolution ADCs, which is one of the hot topics nowadays
  • Keywords
    analogue-digital conversion; switching circuits; transistors; 0.35 micron; SFDR; analog-digital converter; high resolution ADC; linear sampling switch; low-voltage operation; on-conductance; replica transistor; CMOS technology; Linearity; MOS devices; MOSFETs; Sampling methods; Signal resolution; Signal sampling; Switches; Switching circuits; Threshold voltage; Low-Voltage; Nonlinearity; Sampling switch;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2006. CCECE '06. Canadian Conference on
  • Conference_Location
    Ottawa, Ont.
  • Print_ISBN
    1-4244-0038-4
  • Electronic_ISBN
    1-4244-0038-4
  • Type

    conf

  • DOI
    10.1109/CCECE.2006.277737
  • Filename
    4054702