• DocumentCode
    3137142
  • Title

    Investigation of Raman imaging for advanced control of YBCO cool-down processing using pulsed laser deposition

  • Author

    Busbee, J.D. ; Biggers, R.R. ; Jones, J.G. ; Dempsey, D.V. ; Kozlowski, G.

  • Author_Institution
    Res. Lab., Wright-Patterson AFB, OH, USA
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1257
  • Abstract
    Pulsed laser deposition (PLD) is a versatile, complex thin film deposition process that has been shown to be capable of creating high quality YBCO films. However, the promise of the technique has been hampered by a lack of process understanding and visibility into in-situ processes. In the past, attempts at controlling the PLD process have not been highly successful due to a lack of direct feedback from the surface of the film. This paper investigates using Raman spectroscopy to provide feedback from the evolving film during cool-down after deposition. In-situ spectra taken under controlled conditions are examined to understand the effect of environmental parameters on film properties as well to provide insight into evolution of the film microstructure during cool-down
  • Keywords
    Raman spectra; barium compounds; high-temperature superconductors; process control; pulsed laser deposition; stoichiometry; superconducting thin films; yttrium compounds; HTSC cool-down processing; Raman imaging; Raman spectroscopy; YBaCuO; advanced process control; controlled conditions; critical current density; environmental parameters effect; evolving film; feedback; film microstructure; hierarchical process model; in-situ spectra; pulsed laser deposition; stoichiometry; thickness measurement; transition temperature; Feedback; Microstructure; Optical pulses; Process control; Pulsed laser deposition; Raman scattering; Spectroscopy; Sputtering; Temperature control; Yttrium barium copper oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Processing and Manufacturing of Materials, 1999. IPMM '99. Proceedings of the Second International Conference on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-5489-3
  • Type

    conf

  • DOI
    10.1109/IPMM.1999.791554
  • Filename
    791554