DocumentCode
3137358
Title
A Test Methodology for Large Logic Networks
Author
Stange, Gary H.
Author_Institution
IBM Corporation System Products Division, Endicott, NY
fYear
1978
fDate
19-21 June 1978
Firstpage
103
Lastpage
109
Abstract
This paper analyzes a test methodology for large logic networks. In particular, it examines the effects of network sub-division on test system performance.
Keywords
Automatic testing; Circuit testing; Costs; Explosions; Large scale integration; Logic circuits; Logic testing; Packaging; System performance; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1978. 15th Conference on
Type
conf
DOI
10.1109/DAC.1978.1585155
Filename
1585155
Link To Document