Title :
A Test Methodology for Large Logic Networks
Author_Institution :
IBM Corporation System Products Division, Endicott, NY
Abstract :
This paper analyzes a test methodology for large logic networks. In particular, it examines the effects of network sub-division on test system performance.
Keywords :
Automatic testing; Circuit testing; Costs; Explosions; Large scale integration; Logic circuits; Logic testing; Packaging; System performance; System testing;
Conference_Titel :
Design Automation, 1978. 15th Conference on
DOI :
10.1109/DAC.1978.1585155
