DocumentCode :
3137393
Title :
A Unified Approach to Test Data Analysis
Author :
Gianfagna, Michael A.
Author_Institution :
RCA Corporation Solid State Technology Center, Somerville, NJ
fYear :
1978
fDate :
19-21 June 1978
Firstpage :
117
Lastpage :
124
Abstract :
To provide cost-effective performance evaluation or engineering feedback from circuit test results often requires that complex analyses be performed on large volumes of non-standard data. Using a large scale data management system and a modular design philosophy, a system to cope with the above requirements has been developed. TDAS (Test Data Analysis System) has provided timely and economic solutions to test data analysis problems which might have been intractable by other means.
Keywords :
Automatic testing; Circuit testing; Data analysis; Electronic equipment testing; Histograms; Integrated circuit reliability; Performance analysis; Performance evaluation; Semiconductor device measurement; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1978. 15th Conference on
Type :
conf
DOI :
10.1109/DAC.1978.1585157
Filename :
1585157
Link To Document :
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