Title :
Multistage infrared emitters based on InAsSb strained layers grown by metal-organic chemical vapor deposition
Author :
Biefeld, R.M. ; Allerman, A.A. ; Kurtz, S.R. ; Baucom, K.C.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
We report on the metal-organic chemical vapor deposition (MOCVD) of mid-infrared InAsSb multistage emitters using a high speed rotating disk reactor. The devices contain AlAsSb claddings and strained InAsSb active regions. These emitters have multistage, type I, InAsSb/InAsP quantum well active regions. A semi-metal GaAsSb/InAs layer acts as an internal electron source for the multistage injection lasers and AlAsSb is the electron confinement layer. These structures are the first MOCVD multistage devices. Broadband LED´s produced 2 mW average power at 3.7 μm and 80 K and 0.1 mW at 4.3 μm and 300 K. A multistage, 3.8-3.9 μm laser structure operated up to T=180 K. At 80 K, peak-power >110 mW/facet and a high slope-efficiency (48%) were observed in these gain guided lasers
Keywords :
III-V semiconductors; MOCVD; aluminium compounds; gallium arsenide; indium compounds; light emitting diodes; quantum well lasers; semiconductor growth; vapour phase epitaxial growth; 0.1 mW; 180 K; 2 mW; 3.7 mum; 3.8 to 3.9 mum; 300 K; 4.3 mum; 48 percent; 80 K; AlAsSb; AlAsSb cladding; GaAsSb; InAs; InAsP; InAsSb; InAsSb strained layers; InAsSb/InAsP quantum well active regions; MOCVD; broadband LEDs; electron confinement layer; gain guided lasers; high slope-efficiency; high speed rotating disk reactor; internal electron source; metal-organic chemical vapor deposition; mid-infrared InAsSb multistage emitters; multistage infrared emitters; multistage injection lasers; peak-power; semi-metal GaAsSb/InAs layer; strained InAsSb active regions; Chemical lasers; Chemical vapor deposition; Inductors; Light emitting diodes; MOCVD; Organic chemicals; Quantum cascade lasers; Quantum well lasers; Radiative recombination; Spontaneous emission;
Conference_Titel :
Optoelectronic and Microelectronic Materials Devices, 1998. Proceedings. 1998 Conference on
Conference_Location :
Perth, WA
Print_ISBN :
0-7803-4513-4
DOI :
10.1109/COMMAD.1998.791582