DocumentCode :
3137657
Title :
Analytical modeling of base transit time considering recombination in the non-uniformly doped base
Author :
Chowdhury, M.I.B. ; Hassan, M. M Shahidul
Author_Institution :
Dept. of Electr. & Electron. Eng., United Int. Univ., Dhaka, Bangladesh
fYear :
2011
fDate :
6-7 June 2011
Firstpage :
117
Lastpage :
122
Abstract :
The main objective of this paper is to show that recombination in the base needs to be taken into account in determining base transit time τB. In previous analytical works for τB, recombination in the base was neglected. In this paper both drift and diffusion currents for electron and hole are considered in obtaining minority carrier profile n(x). In the model, both SRH and Auger recombination are considered. The energy-bandgap-narrowing effects due to heavy doping, velocity saturation as well as doping and field dependent mobility are considered. The model shows that recombination has significant effects on the base transit time of a heavily doped base.
Keywords :
Auger effect; bipolar transistors; diffusion; doping; electron-hole recombination; energy gap; network synthesis; Auger recombination; base transit time; base transit time τB; carrier profile; diffusion current; drift current; energy-bandgap-narrowing effects; field dependent mobility; heavily doped base; heavy doping; non-uniformly doped base; velocity saturation; Approximation methods; Current density; Differential equations; Doping; Equations; Mathematical model; Spontaneous emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Humanities, Science & Engineering Research (SHUSER), 2011 International Symposium on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4577-0263-1
Type :
conf
DOI :
10.1109/SHUSER.2011.6008482
Filename :
6008482
Link To Document :
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