• DocumentCode
    3137758
  • Title

    MOMBE growth of heavily carbon-doped n-type InP using tertiarybutylphosphine (TBP)

  • Author

    Oh, Je-Hwan ; Shirakashi, Jun-ichi ; Fukuchi, Fumihiko ; Konagai, Makoto ; Azuma, Toshiaki ; Takahashi, Kiyoshi

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Japan
  • fYear
    1995
  • fDate
    9-13 May 1995
  • Firstpage
    797
  • Lastpage
    800
  • Abstract
    Heavily carbon-doped n-type InP was grown by metalorganic molecular beam epitaxy (MOMBE) using elemental In and tertiarybutylphosphine (TBP). In this study, TBP was employed as both phosphorus and carbon source, and carbon-doping characteristics in MOMBE growth of InP using TBP were discussed for the first time. The electron concentration of carbon-doped InP could be controlled in three orders of magnitude (n=1016~1019 cm-3) by varying the growth temperature and TBP cracking temperature. As the TBP cracking temperature increases, electron concentration was increased and also showed less dependence on growth temperature. This indicates that the overall carbon incorporation in InP may be dominated by the more atomic-like carbon-containing species of the cracked TBP. In addition, the lattice location of carbon impurity atom in InP was estimated for the first time by the observation of a gap mode using Raman scattering spectroscopy. The observed peak at 225 cm-1 corresponds to a gap mode due to carbon impurity substituted on In lattice site in InP and shows a good agreement with the theoretical value. This is direct evidence that carbon from TBP is incorporated on In lattice site and acts as a donor in InP
  • Keywords
    III-V semiconductors; Raman spectra; carbon; chemical beam epitaxial growth; electron density; heavily doped semiconductors; indium compounds; semiconductor doping; semiconductor epitaxial layers; semiconductor growth; 225 cm-1; In lattice site; InP:C; MOMBE growth; Raman scattering spectroscopy; TBP; TBP cracking temperature; carbon impurity atom; carbon-doping characteristics; donor; electron concentration; gap mode; growth temperature; heavily C-doped n-type InP; lattice location; tertiarybutylphosphine; Chemical elements; Electrons; Impurities; Indium phosphide; Lattices; Molecular beam epitaxial growth; Raman scattering; Spectroscopy; Temperature control; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on
  • Conference_Location
    Hokkaido
  • Print_ISBN
    0-7803-2147-2
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1995.522264
  • Filename
    522264